Uetrecht, C., Lorenzen, K., Kitel, M., Heidemann, J., Robinson Spencer, J. H., Schlüter, H., & Schulz, J. (2019). Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging. Journal of synchrotron radiation, 26(Pt 3), 653. https://doi.org/10.1107/S1600577519002686
Style de citation ChicagoUetrecht, Charlotte, Kristina Lorenzen, Matthäus Kitel, Johannes Heidemann, Jesse Huron Robinson Spencer, Hartmut Schlüter, et Joachim Schulz. "Native Mass Spectrometry Provides Sufficient Ion Flux for XFEL Single-particle Imaging." Journal of Synchrotron Radiation 26, no. Pt 3 (2019): 653. https://dx.doi.org/10.1107/S1600577519002686.
Style de citation MLAUetrecht, Charlotte, et al. "Native Mass Spectrometry Provides Sufficient Ion Flux for XFEL Single-particle Imaging." Journal of Synchrotron Radiation, vol. 26, no. Pt 3, 2019, p. 653.