APA Zitierstil

Uetrecht, C., Lorenzen, K., Kitel, M., Heidemann, J., Robinson Spencer, J. H., Schlüter, H., & Schulz, J. (2019). Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging. Journal of synchrotron radiation, 26(Pt 3), 653. https://doi.org/10.1107/S1600577519002686

Chicago Zitierstil

Uetrecht, Charlotte, Kristina Lorenzen, Matthäus Kitel, Johannes Heidemann, Jesse Huron Robinson Spencer, Hartmut Schlüter, und Joachim Schulz. "Native Mass Spectrometry Provides Sufficient Ion Flux for XFEL Single-particle Imaging." Journal of Synchrotron Radiation 26, no. Pt 3 (2019): 653. https://dx.doi.org/10.1107/S1600577519002686.

MLA Zitierstil

Uetrecht, Charlotte, et al. "Native Mass Spectrometry Provides Sufficient Ion Flux for XFEL Single-particle Imaging." Journal of Synchrotron Radiation, vol. 26, no. Pt 3, 2019, p. 653.