Reducing the background of ultra-low-temperature X-ray diffraction data through new methods and advanced materials
New methods and advanced materials that significantly reduce the background when collecting single-crystal X-ray diffraction data at ultra-low temperatures using a closed-cycle helium refrigerator are presented here. These include a magnetically controlled internal beamstop and a separate internal c...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 52(2019), Pt 2 vom: 01. Apr., Seite 445-450 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2019
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article X-ray diffraction cryostats data collection low-temperature diffraction technique development |
| Online verfügbar |
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