Indexing grazing-incidence X-ray diffraction patterns of thin films : lattices of higher symmetry

Grazing-incidence X-ray diffraction studies on organic thin films are often performed on systems showing fibre-textured growth. However, indexing their experimental diffraction patterns is generally challenging, especially if low-symmetry lattices are involved. Recently, analytical mathematical expr...

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Publié dans:Journal of applied crystallography. - 1998. - 52(2019), Pt 2 vom: 01. Apr., Seite 428-439
Auteur principal: Simbrunner, Josef (Auteur)
Autres auteurs: Hofer, Sebastian, Schrode, Benedikt, Garmshausen, Yves, Hecht, Stefan, Resel, Roland, Salzmann, Ingo
Format: Article en ligne
Langue:English
Publié: 2019
Accès à la collection:Journal of applied crystallography
Sujets:Journal Article fibre texture grazing incidence X-ray diffraction indexing mathematical crystallography uni-planar texture