Indexing grazing-incidence X-ray diffraction patterns of thin films : lattices of higher symmetry
Grazing-incidence X-ray diffraction studies on organic thin films are often performed on systems showing fibre-textured growth. However, indexing their experimental diffraction patterns is generally challenging, especially if low-symmetry lattices are involved. Recently, analytical mathematical expr...
Description complète
Détails bibliographiques
Publié dans: | Journal of applied crystallography. - 1998. - 52(2019), Pt 2 vom: 01. Apr., Seite 428-439
|
Auteur principal: |
Simbrunner, Josef
(Auteur) |
Autres auteurs: |
Hofer, Sebastian,
Schrode, Benedikt,
Garmshausen, Yves,
Hecht, Stefan,
Resel, Roland,
Salzmann, Ingo |
Format: | Article en ligne
|
Langue: | English |
Publié: |
2019
|
Accès à la collection: | Journal of applied crystallography
|
Sujets: | Journal Article
fibre texture
grazing incidence X-ray diffraction
indexing
mathematical crystallography
uni-planar texture |