Simbrunner, J., Hofer, S., Schrode, B., Garmshausen, Y., Hecht, S., Resel, R., & Salzmann, I. (2019). Indexing grazing-incidence X-ray diffraction patterns of thin films: Lattices of higher symmetry. Journal of applied crystallography, 52(Pt 2), 428. https://doi.org/10.1107/S1600576719003029
Style de citation ChicagoSimbrunner, Josef, Sebastian Hofer, Benedikt Schrode, Yves Garmshausen, Stefan Hecht, Roland Resel, et Ingo Salzmann. "Indexing Grazing-incidence X-ray Diffraction Patterns of Thin Films: Lattices of Higher Symmetry." Journal of Applied Crystallography 52, no. Pt 2 (2019): 428. https://dx.doi.org/10.1107/S1600576719003029.
Style de citation MLASimbrunner, Josef, et al. "Indexing Grazing-incidence X-ray Diffraction Patterns of Thin Films: Lattices of Higher Symmetry." Journal of Applied Crystallography, vol. 52, no. Pt 2, 2019, p. 428.