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|a 10.1107/S160057671800643X
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|a eng
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|a Ilavsky, Jan
|e verfasserin
|4 aut
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|a Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source
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|c 2018
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|a Text
|b txt
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Revised 15.07.2024
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|a published: Print
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|a Citation Status PubMed-not-MEDLINE
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|a Following many years of evolutionary development, first at the National Synchrotron Light Source, Brookhaven National Laboratory, and then at the Advanced Photon Source (APS), Argonne National Laboratory, the APS ultrasmall-angle X-ray scattering (USAXS) facility has been transformed by several new developments. These comprise a conversion to higher-order crystal optics and higher X-ray energies as the standard operating mode, rapid fly scan measurements also as a standard operational mode, automated contiguous pinhole small-angle X-ray scattering (SAXS) measurements at intermediate scattering vectors, and associated rapid wide-angle X-ray scattering (WAXS) measurements for X-ray diffraction without disturbing the sample geometry. With each mode using the USAXS incident beam optics upstream of the sample, USAXS/SAXS/WAXS measurements can now be made within 5 min, allowing in situ and operando measurement capabilities with great flexibility under a wide range of sample conditions. These developments are described, together with examples of their application to investigate materials phenomena of technological importance. Developments of two novel USAXS applications, USAXSbased X-ray photon correlation spectroscopy and USAXS imaging, are also briefly reviewed
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|a Journal Article
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|a X-ray diffraction
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|a insitu studies
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|a microstructure characterization
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|a small-angle X-ray scattering
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|a Zhang, Fan
|e verfasserin
|4 aut
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|a Andrews, Ross N
|e verfasserin
|4 aut
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|a Kuzmenko, Ivan
|e verfasserin
|4 aut
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|a Jemian, Pete R
|e verfasserin
|4 aut
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1 |
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|a Levine, Lyle E
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Allen, Andrew J
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of applied crystallography
|d 1998
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