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231225s2019 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577518017216
|2 doi
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|a pubmed24n0982.xml
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|a (DE-627)NLM294789693
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|a (NLM)30855250
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|a DE-627
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|e rakwb
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|a eng
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|a Zhang, Y Y
|e verfasserin
|4 aut
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|a Deducing density and strength of nanocrystalline Ta and diamond under extreme conditions from X-ray diffraction
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|c 2019
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
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|a Date Completed 13.03.2019
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|a Date Revised 13.03.2019
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a In situ X-ray diffraction with advanced X-ray sources offers unique opportunities for investigating materials properties under extreme conditions such as shock-wave loading. Here, Singh's theory for deducing high-pressure density and strength from two-dimensional (2D) diffraction patterns is rigorously examined with large-scale molecular dynamics simulations of isothermal compression and shock-wave compression. Two representative solids are explored: nanocrystalline Ta and diamond. Analysis of simulated 2D X-ray diffraction patterns is compared against direct molecular dynamics simulation results. Singh's method is highly accurate for density measurement (within 1%) and reasonable for strength measurement (within 10%), and can be used for such measurements on nanocrystalline and polycrystalline solids under extreme conditions (e.g. in the megabar regime)
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|a Journal Article
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|a X-ray diffraction simulation
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|a diamond
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|a diamond anvil cell compression
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|a high-pressure density and strength
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|a molecular dynamics
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|a nanocrystalline Ta
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|a shock compression
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|a Tang, M X
|e verfasserin
|4 aut
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|a Cai, Y
|e verfasserin
|4 aut
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|a E, J C
|e verfasserin
|4 aut
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|a Luo, S N
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 26(2019), Pt 2 vom: 01. März, Seite 413-421
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:26
|g year:2019
|g number:Pt 2
|g day:01
|g month:03
|g pages:413-421
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|u http://dx.doi.org/10.1107/S1600577518017216
|3 Volltext
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