Heimann, P., Reid, A., Feng, Y., & Fritz, D. (2019). Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers. Journal of synchrotron radiation, 26(Pt 2), 358. https://doi.org/10.1107/S1600577519001802
Chicago ZitierstilHeimann, Philip, Alexander Reid, Yiping Feng, und David Fritz. "Fluorescence Intensity Monitors as Intensity and Beam-position Diagnostics for X-ray Free-electron Lasers." Journal of Synchrotron Radiation 26, no. Pt 2 (2019): 358. https://dx.doi.org/10.1107/S1600577519001802.
MLA ZitierstilHeimann, Philip, et al. "Fluorescence Intensity Monitors as Intensity and Beam-position Diagnostics for X-ray Free-electron Lasers." Journal of Synchrotron Radiation, vol. 26, no. Pt 2, 2019, p. 358.