Variability in Postharvest Decay Among Apple Cultivars

The level of resistance to decay caused by four fungal pathogens, the force required to break the epidermis, and the extent of open sinuses as measures of potential decay resistance were determined for the fruit of several apple cultivars. No single cultivar was the most resistant to each of the fou...

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Détails bibliographiques
Publié dans:Plant disease. - 1997. - 83(1999), 11 vom: 30. Nov., Seite 1051-1054
Auteur principal: Spotts, R A (Auteur)
Autres auteurs: Cervantes, L A, Mielke, E A
Format: Article en ligne
Langue:English
Publié: 1999
Accès à la collection:Plant disease
Sujets:Journal Article Mucor rot blue mold bull's-eye rot gray mold