Surface and Interface Properties in Thin-Film Solar Cells : Using Soft X-rays and Electrons to Unravel the Electronic and Chemical Structure

© 2019 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 31(2019), 26 vom: 21. Juni, Seite e1806660
1. Verfasser: Weinhardt, Lothar (VerfasserIn)
Weitere Verfasser: Hauschild, Dirk, Heske, Clemens
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2019
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Review chemical structures electronic structures surface characterization thin-film solar cells
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520 |a Thin-film solar cells have great potential to overtake the currently dominant silicon-based solar cell technologies in a strongly growing market. Such thin-film devices consist of a multilayer structure, for which charge-carrier transport across interfaces plays a crucial role in minimizing the associated recombination losses and achieving high solar conversion efficiencies. Further development can strongly profit from a high-level characterization that gives a local, electronic, and chemical picture of the interface properties, which allows for an insight-driven optimization. Herein, the authors' recent progress of applying a "toolbox" of high-level laboratory- and synchrotron-based electron and soft X-ray spectroscopies to characterize the chemical and electronic properties of such applied interfaces is provided. With this toolbox in hand, the activities are paired with those of experts in thin-film solar cell preparation at the cutting edge of current developments to obtain a deeper understanding of the recent improvements in the field, e.g., by studying the influence of so-called "post-deposition treatments", as well as characterizing the properties of interfaces with alternative buffer layer materials that give superior efficiencies on large, module-sized areas 
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