Assessing the Adequacy of the Simulation Model LATEBLIGHT Under Nicaraguan Conditions

In this study, the adequacy of the late blight simulation model LATEBLIGHT (version LB2004) was evaluated under Nicaraguan conditions. During 2007 to 2008, five field experiments were conducted in three potato-production regions in northern Nicaragua. Two susceptible ('Cal White' and '...

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Bibliographische Detailangaben
Veröffentlicht in:Plant disease. - 1997. - 95(2011), 7 vom: 14. Juli, Seite 839-846
1. Verfasser: Blandón-Díaz, Jorge Ulises (VerfasserIn)
Weitere Verfasser: Forbes, Gregory A, Andrade-Piedra, Jorge L, Yuen, Jonathan E
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2011
Zugriff auf das übergeordnete Werk:Plant disease
Schlagworte:Journal Article
Beschreibung
Zusammenfassung:In this study, the adequacy of the late blight simulation model LATEBLIGHT (version LB2004) was evaluated under Nicaraguan conditions. During 2007 to 2008, five field experiments were conducted in three potato-production regions in northern Nicaragua. Two susceptible ('Cal White' and 'Granola') and one resistant ('Jacqueline Lee') potato cultivars were evaluated without use of fungicides and with three application intervals (4, 7, and 14 days) of the fungicide chlorothalonil. The simulation model was considered adequate because it accurately predicted high disease severity in susceptible cultivars without fungicide protection, and demonstrated a decrease in the disease progress curves with additional fungicide applications, similar to that observed in the plots. The model also generally predicted inadequate fungicide control, even with a 4-day spray interval, which also occurred in the field. Lack of adequate fungicide protection would indicate the need for cultivars with higher levels of durable resistance, and that farmers should consider more effective fungicides applications (higher dosages or different chemistries) if susceptible cultivars are used
Beschreibung:Date Revised 20.11.2019
published: Print
Citation Status PubMed-not-MEDLINE
ISSN:0191-2917
DOI:10.1094/PDIS-10-10-0702