Electrochemical Modification and Characterization of Topological Insulator Single Crystals
We compare electrochemically modified or thiol-functionalized single-crystal samples of the topological insulator (TI) Bi2Te0.9Se2.1 to freshly cleaved/air-exposed control samples and use X-ray photoelectron spectroscopy (XPS) to investigate the extent of any surface oxidation. XPS spectra for a TI...
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Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 35(2019), 8 vom: 26. Feb., Seite 2983-2988
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| Auteur principal: |
Yang, Chaolong
(Auteur) |
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| Autres auteurs: |
Cattelan, Mattia,
Fox, Neil,
Huang, Yingkai,
Golden, Mark S,
Schwarzacher, Walther |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2019
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article |
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