X-ray diffraction reveals blunt-force loading threshold for nanoscopic structural change in ex vivo neuronal tissues

An ex vivo blunt-force loading experiment is reported that may, in the future, provide insight into the molecular structural changes occurring in load-induced conditions such as traumatic brain injury (TBI). TBI appears to manifest in changes in multiple structures and elements within the brain and...

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Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 26(2019), Pt 1 vom: 01. Jan., Seite 89-95
1. Verfasser: Orgel, Joseph (VerfasserIn)
Weitere Verfasser: Madhurapantula, Rama S, Eidsmore, Ashley, Wang, Meng, Dutov, Pavel, Modrich, Charles D, Antipova, Olga, McDonald, Jason, Satapathy, Sikhanda
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2019
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray diffraction blunt-force ex vivo loading myelin