Feasibility study of phase-contrast X-ray laminography using X-ray interferometry
For fine observation of laminar samples, phase-contrast X-ray laminography using X-ray interferometry was developed. An imaging system fitted with a two-crystal X-ray interferometer was used to perform the observations, and the sectional images were calculated by a three-dimensional iterative recons...
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Détails bibliographiques
Publié dans: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 6 vom: 01. Nov., Seite 1841-1846
|
Auteur principal: |
Yoneyama, Akio
(Auteur) |
Autres auteurs: |
Hyodo, Kazuyuki,
Baba, Rika,
Takeya, Satoshi,
Takeda, Tohoru |
Format: | Article en ligne
|
Langue: | English |
Publié: |
2018
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Accès à la collection: | Journal of synchrotron radiation
|
Sujets: | Journal Article
X-ray laminography
crystal interferometer
phase-contrast X-ray imaging |