Feasibility study of phase-contrast X-ray laminography using X-ray interferometry

For fine observation of laminar samples, phase-contrast X-ray laminography using X-ray interferometry was developed. An imaging system fitted with a two-crystal X-ray interferometer was used to perform the observations, and the sectional images were calculated by a three-dimensional iterative recons...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 25(2018), Pt 6 vom: 01. Nov., Seite 1841-1846
Auteur principal: Yoneyama, Akio (Auteur)
Autres auteurs: Hyodo, Kazuyuki, Baba, Rika, Takeya, Satoshi, Takeda, Tohoru
Format: Article en ligne
Langue:English
Publié: 2018
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article X-ray laminography crystal interferometer phase-contrast X-ray imaging