A comparison of parametric and integrative approaches for X-ray fluorescence analysis applied to a Stroke model
Synchrotron X-ray fluorescence imaging enables visualization and quantification of microscopic distributions of elements. This versatile technique has matured to the point where it is used in a wide range of research fields. The method can be used to quantitate the levels of different elements in th...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 6 vom: 01. Nov., Seite 1780-1789
|
|---|
| 1. Verfasser: |
Crawford, Andrew M
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Sylvain, Nicole J,
Hou, Huishu,
Hackett, Mark J,
Pushie, M Jake,
Pickering, Ingrid J,
George, Graham N,
Kelly, Michael E |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2018
|
|---|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
|
|---|
| Schlagworte: | Journal Article
M-BLANK
X-ray fluorescence
Xpress 3 electronics
strokes
window binning |
|---|