Synchrotron radiation X-ray fluorescence microscopy is frequently used to investigate the spatial distribution of elements within a wide range of samples. Interrogation of heterogeneous samples that contain large concentration ranges has the potential to produce image artefacts due to the profile of...
Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 6 vom: 01. Nov., Seite 1719-1726
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| Auteur principal: |
Morrell, Alexander P
(Auteur) |
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| Autres auteurs: |
Mosselmans, J Frederick W,
Geraki, Kalotina,
Ignatyev, Konstantin,
Castillo-Michel, Hiram,
Monksfield, Peter,
Warfield, Adrian T,
Febbraio, Maria,
Roberts, Helen M,
Addison, Owen,
Martin, Richard A |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2018
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article
X-ray fluorescence microscopy
X-ray fluorescence spectroscopy artefacts |
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