2D AlN Layers Sandwiched Between Graphene and Si Substrates

© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Détails bibliographiques
Publié dans:Advanced materials (Deerfield Beach, Fla.). - 1998. - 31(2019), 2 vom: 17. Jan., Seite e1803448
Auteur principal: Wang, Wenliang (Auteur)
Autres auteurs: Zheng, Yulin, Li, Xiaochan, Li, Yuan, Zhao, Hui, Huang, Liegen, Yang, Zhichao, Zhang, Xiaona, Li, Guoqiang
Format: Article en ligne
Langue:English
Publié: 2019
Accès à la collection:Advanced materials (Deerfield Beach, Fla.)
Sujets:Journal Article 2D AlN bandgap first-principles calculations transmission electron microscopy
Description
Résumé:© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Due to the superior thickness-dependent properties, 2D materials have exhibited great potential for applications in next-generation optoelectronic devices. Despite the significant progress that has been achieved, the synthesis of 2D AlN remains challenging. This work reports on the epitaxial growth of 2D AlN layers via utilizing physically transferred graphene on Si substrates by metal-organic chemical vapor deposition. The 2D AlN layers sandwiched between graphene and Si substrates are confirmed by annular bright-field scanning transmission electron microscopy and the effect of hydrogenation on the formation of 2D AlN layers is clarified by theoretical calculations with first-principles calculations based on density functional theory. Moreover, the bandgap of as-grown 2D AlN layers is theoretically predicted to be ≈9.63 eV and is experimentally determined to be 9.20-9.60 eV. This ultrawide bandgap semiconductor shows great promise in deep-ultraviolet optoelectronic applications. These results are expected to support innovative and front-end development of optoelectronic devices
Description:Date Completed 11.01.2019
Date Revised 30.09.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201803448