Model-free classification of X-ray scattering signals applied to image segmentation

In most cases, the analysis of small-angle and wide-angle X-ray scattering (SAXS and WAXS, respectively) requires a theoretical model to describe the sample's scattering, complicating the interpretation of the scattering resulting from complex heterogeneous samples. This is the reason why, in g...

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Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 51(2018), Pt 5 vom: 01. Okt., Seite 1378-1386
1. Verfasser: Lutz-Bueno, V (VerfasserIn)
Weitere Verfasser: Arboleda, C, Leu, L, Blunt, M J, Busch, A, Georgiadis, A, Bertier, P, Schmatz, J, Varga, Z, Villanueva-Perez, P, Wang, Z, Lebugle, M, David, C, Stampanoni, M, Diaz, A, Guizar-Sicairos, M, Menzel, A
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2018
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article anisotropic nanostructures electromagnetic modeling polarized resonant soft X-ray scattering