Soft Nondamaging Contacts Formed from Eutectic Ga-In for the Accurate Determination of Dielectric Constants of Organic Materials
A method for accurately measuring the relative dielectric constant (εr) of thin films of soft, organic materials is described. The effects of the bombardment of these materials with hot Al atoms, the most commonly used top electrode, are mitigated by using electrodes fabricated from eutectic gallium...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Chemistry of materials : a publication of the American Chemical Society. - 1998. - 30(2018), 16 vom: 28. Aug., Seite 5527-5533
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| 1. Verfasser: |
Douvogianni, Evgenia
(VerfasserIn) |
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| Weitere Verfasser: |
Qiu, Xinkai,
Qiu, Li,
Jahani, Fatemeh,
Kooistra, Floris B,
Hummelen, Jan C,
Chiechi, Ryan C |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | Chemistry of materials : a publication of the American Chemical Society
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| Schlagworte: | Journal Article |
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