Soft X-ray refractive index by reconciling total electron yield with specular reflection : experimental determination of the optical constants of graphite

The complex refractive index of many materials is poorly known in the soft X-ray range across absorption edges. This is due to saturation effects that occur there in total-electron-yield and fluorescence-yield spectroscopy and that are strongest at resonance energies. Aiming to obtain reliable optic...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 25(2018), Pt 5 vom: 01. Sept., Seite 1433-1443
1. Verfasser:	Jansing, C (VerfasserIn)
Weitere Verfasser:	Wahab, H, Timmers, H, Gaupp, A, Mertins, H C
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2018
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article X-ray spectroscopy birefringence graphite optical constants soft X-rays