Soft X-ray refractive index by reconciling total electron yield with specular reflection : experimental determination of the optical constants of graphite

The complex refractive index of many materials is poorly known in the soft X-ray range across absorption edges. This is due to saturation effects that occur there in total-electron-yield and fluorescence-yield spectroscopy and that are strongest at resonance energies. Aiming to obtain reliable optic...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 25(2018), Pt 5 vom: 01. Sept., Seite 1433-1443
1. Verfasser: Jansing, C (VerfasserIn)
Weitere Verfasser: Wahab, H, Timmers, H, Gaupp, A, Mertins, H C
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2018
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray spectroscopy birefringence graphite optical constants soft X-rays