Soft X-ray refractive index by reconciling total electron yield with specular reflection : experimental determination of the optical constants of graphite
The complex refractive index of many materials is poorly known in the soft X-ray range across absorption edges. This is due to saturation effects that occur there in total-electron-yield and fluorescence-yield spectroscopy and that are strongest at resonance energies. Aiming to obtain reliable optic...
Ausführliche Beschreibung
Bibliographische Detailangaben
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 5 vom: 01. Sept., Seite 1433-1443
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1. Verfasser: |
Jansing, C
(VerfasserIn) |
Weitere Verfasser: |
Wahab, H,
Timmers, H,
Gaupp, A,
Mertins, H C |
Format: | Online-Aufsatz
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Sprache: | English |
Veröffentlicht: |
2018
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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Schlagworte: | Journal Article
X-ray spectroscopy
birefringence
graphite
optical constants
soft X-rays |