Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources

Polychromatic synchrotron undulator X-ray sources are useful for ultrafast single-crystal diffraction under shock compression. Here, simulations of X-ray diffraction of shock-compressed single-crystal tantalum with realistic undulator sources are reported, based on large-scale molecular dynamics sim...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 25(2018), Pt 3 vom: 01. Mai, Seite 748-756
1. Verfasser: Tang, M X (VerfasserIn)
Weitere Verfasser: Zhang, Y Y, E, J C, Luo, S N
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2018
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray diffraction simulation lattice strain molecular dynamics single-crystal tantalum synchrotron undulator sources