Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications
A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to the in situ observation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan o...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 3 vom: 01. Mai, Seite 706-716 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article X-ray reflectivity film growth in situ quick XRR time-resolved |
| Online verfügbar |
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