In Situ Time-Resolved Attenuated Total Reflectance Infrared Spectroscopy for Probing Metal-Organic Framework Thin Film Growth
In situ chemical measurements of solution/surface reactions during metal-organic framework (MOF) thin film growth can provide valuable information about the mechanistic and kinetic aspects of key reaction steps, and allow control over crystal quality and material properties. Here, we report a new ap...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Chemistry of materials : a publication of the American Chemical Society. - 1998. - 29(2017), 20 vom: 24. Okt., Seite 8804-8810
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| 1. Verfasser: |
Zhao, Junjie
(VerfasserIn) |
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| Weitere Verfasser: |
Kalanyan, Berc,
Barton, Heather F,
Sperling, Brent A,
Parsons, Gregory N |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Chemistry of materials : a publication of the American Chemical Society
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| Schlagworte: | Journal Article |
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