Counting-loss correction for X-ray spectroscopy using unit impulse pulse shaping
High-precision measurement of X-ray spectra is affected by the statistical fluctuation of the X-ray beam under low-counting-rate conditions. It is also limited by counting loss resulting from the dead-time of the system and pile-up pulse effects, especially in a high-counting-rate environment. In th...
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Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 2 vom: 01. März, Seite 505-513
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| Auteur principal: |
Hong, Xu
(Auteur) |
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| Autres auteurs: |
Zhou, Jianbin,
Ni, Shijun,
Ma, Yingjie,
Yao, Jianfeng,
Zhou, Wei,
Liu, Yi,
Wang, Min |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2018
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article
FAST-SDD detector
X-ray spectroscopy
counting loss correction
unit impulse pulse shaping |
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