Effect of reflection and refraction on NEXAFS spectra measured in TEY mode
The evolution of near-edge X-ray absorption fine structure in the vicinity of the K-absorption edge of oxygen for HfO2 over a wide range of incidence angles is analyzed by simultaneous implementation of the total-electron-yield (TEY) method and X-ray reflection spectroscopy. It is established that t...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 1 vom: 01. Jan., Seite 232-240 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2018
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article NEXAFS X-ray reflection spectroscopy total electron yield method |
| Online verfügbar |
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