Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL
This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 1 vom: 01. Jan., Seite 204-213
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| 1. Verfasser: |
Mocuta, Cristian
(VerfasserIn) |
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| Weitere Verfasser: |
Stanescu, Stefan,
Gallard, Manon,
Barbier, Antoine,
Dawiec, Arkadiusz,
Kedjar, Bouzid,
Leclercq, Nicolas,
Thiaudiere, Dominique |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
X-ray reflectivity
hybrid pixel area detector |
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