Single-shot arrival timing diagnostics for a soft X-ray free-electron laser beamline at SACLA

Arrival timing diagnostics performed at a soft X-ray free-electron laser (FEL) beamline of SACLA are described. Intense soft X-ray FEL pulses with one-dimensional focusing efficiently induce transient changes of optical reflectivity on the surface of GaAs. The arrival timing between soft X-ray FEL a...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 25(2018), Pt 1 vom: 01. Jan., Seite 68-71
1. Verfasser: Owada, Shigeki (VerfasserIn)
Weitere Verfasser: Nakajima, Kyo, Togashi, Tadashi, Kayatama, Tetsuo, Yabashi, Makina
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2018
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray free-electron laser arrival timing diagnostics soft X-rays
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520 |a Arrival timing diagnostics performed at a soft X-ray free-electron laser (FEL) beamline of SACLA are described. Intense soft X-ray FEL pulses with one-dimensional focusing efficiently induce transient changes of optical reflectivity on the surface of GaAs. The arrival timing between soft X-ray FEL and optical laser pulses was successfully measured as a spatial position of the reflectivity change. The temporal resolution evaluated from the imaging system reaches ∼10 fs. This method requires only a small portion of the incident pulse energy, which enables the simultaneous operation of the arrival timing diagnostics and experiments by introducing a wavefront-splitting scheme 
650 4 |a Journal Article 
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700 1 |a Nakajima, Kyo  |e verfasserin  |4 aut 
700 1 |a Togashi, Tadashi  |e verfasserin  |4 aut 
700 1 |a Kayatama, Tetsuo  |e verfasserin  |4 aut 
700 1 |a Yabashi, Makina  |e verfasserin  |4 aut 
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