Characterization of ultrafast free-electron laser pulses using extreme-ultraviolet transient gratings

The characterization of the time structure of ultrafast photon pulses in the extreme-ultraviolet (EUV) and soft X-ray spectral ranges is of high relevance for a number of scientific applications and photon diagnostics. Such measurements can be performed following different strategies and often requi...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 25(2018), Pt 1 vom: 01. Jan., Seite 32-38
1. Verfasser: Capotondi, F (VerfasserIn)
Weitere Verfasser: Foglia, L, Kiskinova, M, Masciovecchio, C, Mincigrucci, R, Naumenko, D, Pedersoli, E, Simoncig, A, Bencivenga, F
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2018
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article XUV pulse duration diagnostic free-electron laser transient grating spectroscopy