Wan, Q., Abrams, K. J., Masters, R. C., Talari, A. C. S., Rehman, I. U., Claeyssens, F., . . . Rodenburg, C. (2017). Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging. Advanced materials (Deerfield Beach, Fla.), 29(47), . https://doi.org/10.1002/adma.201703510
Style de citation ChicagoWan, Quan, Kerry J. Abrams, Robert C. Masters, Abdullah C S. Talari, Ihtesham U. Rehman, Frederik Claeyssens, Chris Holland, et Cornelia Rodenburg. "Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging." Advanced Materials (Deerfield Beach, Fla.) 29, no. 47 (2017). https://dx.doi.org/10.1002/adma.201703510.
Style de citation MLAWan, Quan, et al. "Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging." Advanced Materials (Deerfield Beach, Fla.), vol. 29, no. 47, 2017.