APA Zitierstil

Davtyan, A., Lehmann, S., Kriegner, D., Zamani, R. R., Dick, K. A., Bahrami, D., . . . Holý, V. (2017). Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction. Journal of synchrotron radiation, 24(Pt 5), 981. https://doi.org/10.1107/S1600577517009584

Chicago Zitierstil

Davtyan, Arman, et al. "Characterization of Individual Stacking Faults in A wurtzite GaAs Nanowire by Nanobeam X-ray Diffraction." Journal of Synchrotron Radiation 24, no. Pt 5 (2017): 981. https://dx.doi.org/10.1107/S1600577517009584.

MLA Zitierstil

Davtyan, Arman, et al. "Characterization of Individual Stacking Faults in A wurtzite GaAs Nanowire by Nanobeam X-ray Diffraction." Journal of Synchrotron Radiation, vol. 24, no. Pt 5, 2017, p. 981.