Incorporation of interfacial roughness into recursion matrix formalism of dynamical X-ray diffraction in multilayers and superlattices
Diffraction in multilayers in the presence of interfacial roughness is studied theoretically, the roughness being considered as a transition layer. Exact (within the framework of the two-beam dynamical diffraction theory) differential equations for field amplitudes in a crystalline structure with va...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 681-688 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article dynamical diffraction interfacial roughness multilayers recursion matrix formalism transition layers |
| Online verfügbar |
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