Quantitative evaluation of statistical errors in small-angle X-ray scattering measurements
A new model is proposed for the measurement errors incurred in typical small-angle X-ray scattering (SAXS) experiments, which takes into account the setup geometry and physics of the measurement process. The model accurately captures the experimentally determined errors from a large range of synchro...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 50(2017), Pt 2 vom: 01. Apr., Seite 621-630 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article SAXS hybrid pixel detectors measurement errors scattering profiles simulations small-angle X-ray scattering |
| Online verfügbar |
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