Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first...
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Bibliographische Detailangaben
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 50(2017), Pt 2 vom: 01. Apr., Seite 561-569
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| 1. Verfasser: |
Tran Thi, Thu Nhi
(VerfasserIn) |
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| Weitere Verfasser: |
Morse, J,
Caliste, D,
Fernandez, B,
Eon, D,
Härtwig, J,
Barbay, C,
Mer-Calfati, C,
Tranchant, N,
Arnault, J C,
Lafford, T A,
Baruchel, J |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography
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| Schlagworte: | Journal Article
X-ray diffaction
diamond
rocking curve imaging
topography |
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