Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy

The properties of the outermost surfaces of mesoporous silica thin films are critical in determining their functions. Obtaining information on the presence or absence of silica layers on the film surfaces and on the degree of mesopore opening is essential for applications of surface mesopores. In th...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 33(2017), 9 vom: 07. März, Seite 2148-2156
1. Verfasser: Kobayashi, Maho (VerfasserIn)
Weitere Verfasser: Susuki, Kyoka, Otsuji, Haruo, Sakuda, Yusuke, Asahina, Shunsuke, Kikuchi, Naoki, Kanazawa, Toshiyuki, Kuroda, Yoshiyuki, Wada, Hiroaki, Shimojima, Atsushi, Kuroda, Kazuyuki
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article Research Support, Non-U.S. Gov't