X-ray fluorescence at nanoscale resolution for multicomponent layered structures : a solar cell case study
The study of a multilayered and multicomponent system by spatially resolved X-ray fluorescence microscopy poses unique challenges in achieving accurate quantification of elemental distributions. This is particularly true for the quantification of materials with high X-ray attenuation coefficients, d...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 24(2017), Pt 1 vom: 01. Jan., Seite 288-295
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| 1. Verfasser: |
West, Bradley M
(VerfasserIn) |
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| Weitere Verfasser: |
Stuckelberger, Michael,
Jeffries, April,
Gangam, Srikanth,
Lai, Barry,
Stripe, Benjamin,
Maser, Jörg,
Rose, Volker,
Vogt, Stefan,
Bertoni, Mariana I |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
CIGS
X-ray fluorescence
multilayered structure
solar cell
thin film characterization |
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