Detection of atomic force microscopy cantilever displacement with a transmitted electron beam
The response time of an atomic force microscopy (AFM) cantilever can be decreased by reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the smallest size that can be detected with the conventional optical lever approach. Here, we demonstrate an electron beam detecti...
| Veröffentlicht in: | Applied physics letters. - 1998. - 109(2016), 4 vom: 25. Juli |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2016
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| Zugriff auf das übergeordnete Werk: | Applied physics letters |
| Schlagworte: | Journal Article |