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231224s2016 xx |||||o 00| ||eng c |
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|a 10.1002/adma.201602125
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|a eng
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|a Kaphle, Vikash
|e verfasserin
|4 aut
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|a Contact Resistance Effects in Highly Doped Organic Electrochemical Transistors
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|c 2016
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|a Text
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|a ƒaComputermedien
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|a Date Completed 17.07.2018
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|a Date Revised 01.10.2020
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Injection at the source contact critically determines the behavior of depletion-type organic electrochemical transistors (OETs). The contact resistance of OETs increases exponentially with the gate voltage and strongly influences the modulation of the drain current by the gate voltage over a wide voltage range. A modified standard model accounting contact resistance can explain the particular shape of the transconductance
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|a Journal Article
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|a contact resistance
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|a organic electrochemical transistors
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|a transconductance
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|a Liu, Shiyi
|e verfasserin
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|a Al-Shadeedi, Akram
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Keum, Chang-Min
|e verfasserin
|4 aut
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|a Lüssem, Björn
|e verfasserin
|4 aut
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
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|g 28(2016), 39 vom: 11. Okt., Seite 8766-8770
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