Room-temperature macromolecular crystallography using a micro-patterned silicon chip with minimal background scattering
Recent success at X-ray free-electron lasers has led to serial crystallography experiments staging a comeback at synchrotron sources as well. With crystal lifetimes typically in the millisecond range and the latest-generation detector technologies with high framing rates up to 1 kHz, fast sample exc...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 49(2016), Pt 3 vom: 01. Juni, Seite 968-975 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2016
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article X-ray radiation damage crystallography on a chip room-temperature crystallography synchrotron serial crystallography |