Topology and temperature dependence of the diffuse X-ray scattering in Na0.5Bi0.5TiO3 ferroelectric single crystals
The results of high-resolution measurements of the diffuse X-ray scattering produced by a perovskite-based Na0.5Bi0.5TiO3 ferroelectric single crystal between 40 and 620 K are reported. The study was designed as an attempt to resolve numerous controversies regarding the average structure of Na0.5Bi0...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 48(2015), Pt 5 vom: 01. Okt., Seite 1543-1550 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2015
|
| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article Na0.5Bi0.5TiO3 high-resolution X-ray diffraction lead-free ferroelectrics perovskites single-crystal diffuse X-ray scattering |