Origins of polarization-dependent anisotropic X-ray scattering from organic thin films
Organic thin films that have no overall in-plane directional ordering often nonetheless produce anisotropic scattering patterns that rotate with the polarization of incident resonant X-rays. Isotropic symmetry is broken by local correlations between molecular orientation and domain structure. Such e...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 23(2016), 1 vom: 25. Jan., Seite 219-27 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2016
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article Research Support, U.S. Gov't, Non-P.H.S. PSoXS RSoXS polarization resonant scattering scattering simulation |
| Zusammenfassung: | Organic thin films that have no overall in-plane directional ordering often nonetheless produce anisotropic scattering patterns that rotate with the polarization of incident resonant X-rays. Isotropic symmetry is broken by local correlations between molecular orientation and domain structure. Such examples of molecular alignment at domain interfaces and within the bulk of domains, which are both critical to fields such as organic electronics, are simulated and compared with experimental scattering. Anisotropic scattering patterns are found to allow unambiguous identification of the mechanism of local molecular orientation correlations and, as such, promise to be both distinct and complementary to isotropic scattering intensity as a general measure of thin film microstructure |
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| Beschreibung: | Date Completed 20.04.2016 Date Revised 24.12.2015 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/S1600577515019074 |