Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping estimation from X-ray Debye-Waller factors

Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping : estimation from X-ray Debye-Waller factors

Cubic type room-temperature (RT) epitaxial Li0.5Ni0.5O and NiO thin films with [111] orientation grown on ultra-smooth sapphire (0001) substrates were examined using synchrotron-based thin-film X-ray diffraction. The 1[Formula: see text]1 and 2[Formula: see text]2 rocking curves including six respec...

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Veröffentlicht in:Journal of applied crystallography. - 1998. - 48(2015), Pt 6 vom: 01. Dez., Seite 1896-1900
1. Verfasser: Yang, Anli (VerfasserIn)
Weitere Verfasser: Sakata, Osami, Yamauchi, Ryosuke, Kumara, L S R, Song, Chulho, Katsuya, Yoshio, Matsuda, Akifumi, Yoshimoto, Mamoru
Format: Aufsatz
Sprache:English
Veröffentlicht: 2015
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article Debye–Waller factors Li doping atomic disorder thin films