X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline : ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in γ-Al2O3

The 2-4 keV energy range provides a rich window into many facets of materials science and chemistry. Within this window, P, S, Cl, K and Ca K-edges may be found along with the L-edges of industrially important elements from Y through to Sn. Yet, compared with those that cater for energies above ca....

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Publié dans:	Journal of synchrotron radiation. - 1994. - 22(2015), 6 vom: 11. Nov., Seite 1426-39
Auteur principal:	Thompson, Paul B J (Auteur)
Autres auteurs:	Nguyen, Bao N, Nicholls, Rachel, Bourne, Richard A, Brazier, John B, Lovelock, Kevin R J, Brown, Simon D, Wermeille, Didier, Bikondoa, Oier, Lucas, Christopher A, Hase, Thomas P A, Newton, Mark A
Format:	Article en ligne
Langue:	English
Publié:	2015
Accès à la collection:	Journal of synchrotron radiation
Sujets:	Journal Article Research Support, Non-U.S. Gov't catalysts in situ spectroscopy ionic liquids low-energy X-ray absorption spectroscopy