Upgrade of beamline BL08B at Taiwan Light Source from a photon-BPM to a double-grating SGM beamline

During the last 20 years, beamline BL08B has been upgraded step by step from a photon beam-position monitor (BPM) to a testing beamline and a single-grating beamline that enables experiments to record X-ray photo-emission spectra (XPS) and X-ray absorption spectra (XAS) for research in solar physics...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 22(2015), 5 vom: 20. Sept., Seite 1312-8
1. Verfasser: Yuh, Jih Young (VerfasserIn)
Weitere Verfasser: Lin, Shan Wei, Huang, Liang Jen, Fung, Hok Sum, Lee, Long Life, Chen, Yu Joung, Cheng, Chiu Ping, Chin, Yi Ying, Lin, Hong Ji
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2015
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Taiwan Light Source extreme ultraviolet (EUV) photon beam-position monitor (BPM) soft X-rays spherical-grating monochromator (SGM) beamline
Beschreibung
Zusammenfassung:During the last 20 years, beamline BL08B has been upgraded step by step from a photon beam-position monitor (BPM) to a testing beamline and a single-grating beamline that enables experiments to record X-ray photo-emission spectra (XPS) and X-ray absorption spectra (XAS) for research in solar physics, organic semiconductor materials and spinel oxides, with soft X-ray photon energies in the range 300-1000 eV. Demands for photon energy to extend to the extreme ultraviolet region for applications in nano-fabrication and topological thin films are increasing. The basic spherical-grating monochromator beamline was again upgraded by adding a second grating that delivers photons of energy from 80 to 420 eV. Four end-stations were designed for experiments with XPS, XAS, interstellar photoprocess systems (IPS) and extreme-ultraviolet lithography (EUVL) in the scheduled beam time. The data from these experiments show a large count rate in core levels probed and excellent statistics on background normalization in the L-edge adsorption spectrum
Beschreibung:Date Completed 29.10.2015
Date Revised 20.08.2015
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577515014009