Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging
Rocking curve imaging (projection and section X-ray topography) has been used to study the generation and propagation of defects at the junctions between and above the seed crystals in mono-like silicon ingots. The images of different kinds of defects such as precipitates, dislocations and twins in...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 48(2015), Pt 3 vom: 01. Juni, Seite 645-654 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2015
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article X-ray Bragg diffraction imaging defect characterization photovoltaic applications |