X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spec...
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 22(2015), 3 vom: 30. Mai, Seite 766-75
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| 1. Verfasser: |
Uhlig, J
(VerfasserIn) |
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| Weitere Verfasser: |
Doriese, W B,
Fowler, J W,
Swetz, D S,
Jaye, C,
Fischer, D A,
Reintsema, C D,
Bennett, D A,
Vale, L R,
Mandal, U,
O'Neil, G C,
Miaja-Avila, L,
Joe, Y I,
El Nahhas, A,
Fullagar, W,
Gustafsson, F Parnefjord,
Sundström, V,
Kurunthu, D,
Hilton, G C,
Schmidt, D R,
Ullom, J N |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2015
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.
X-ray emission spectroscopy (XES)
X-ray spectroscopy
energy-dispersive X-ray detector
low-temperature detector
microcalorimeter
resonant inelastic x-ray scattering (RIXS) |
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