Simultaneous multiplexed materials characterization using a high-precision hard X-ray micro-slit array

The needs both for increased experimental throughput and for in operando characterization of functional materials under increasingly realistic experimental conditions have emerged as major challenges across the whole of crystallography. A novel measurement scheme that allows multiplexed simultaneous...

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Publié dans:	Journal of synchrotron radiation. - 1994. - 22(2015), 3 vom: 30. Mai, Seite 653-60
Auteur principal:	Zhang, Fan (Auteur)
Autres auteurs:	Allen, Andrew J, Levine, Lyle E, Mancini, Derrick C, Ilavsky, Jan
Format:	Article en ligne
Langue:	English
Publié:	2015
Accès à la collection:	Journal of synchrotron radiation
Sujets:	Journal Article Research Support, U.S. Gov't, Non-P.H.S. heterogeneous structure measurement-in-parallel multiplexed materials characterization simultaneous in operando characterization uncertainty reduction