APA Zitierstil

Cui, A., Liu, Z., Dong, H., Wang, Y., Zhen, Y., Li, W., . . . Hu, W. (2015). Single grain boundary break junction for suspended nanogap electrodes with gapwidth down to 1-2 nm by focused ion beam milling. Advanced materials (Deerfield Beach, Fla.), 27(19), 3002. https://doi.org/10.1002/adma.201500527

Chicago Zitierstil

Cui, Ajuan, Zhe Liu, Huanli Dong, Yujin Wang, Yonggang Zhen, Wuxia Li, Junjie Li, Changzhi Gu, und Wenping Hu. "Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 Nm by Focused Ion Beam Milling." Advanced Materials (Deerfield Beach, Fla.) 27, no. 19 (2015): 3002. https://dx.doi.org/10.1002/adma.201500527.

MLA Zitierstil

Cui, Ajuan, et al. "Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 Nm by Focused Ion Beam Milling." Advanced Materials (Deerfield Beach, Fla.), vol. 27, no. 19, 2015, p. 3002.