Atom-resolved analysis of an ionic KBr(001) crystal surface covered with a thin water layer by frequency modulation atomic force microscopy
An ionic KBr(001) crystal surface covered with a thin water layer was observed with a frequency modulation atomic force microscope (FM-AFM) with atomic resolution. By immersing only the tip apex of the AFM cantilever in the thin water layer, the Q-factor of the cantilever in probing the solid-liquid...
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Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 31(2015), 13 vom: 07. Apr., Seite 3876-83
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| 1. Verfasser: |
Arai, Toyoko
(VerfasserIn) |
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| Weitere Verfasser: |
Koshioka, Masashi,
Abe, Kouhei,
Tomitori, Masahiko,
Kokawa, Ryohei,
Ohta, Masahiro,
Yamada, Hirofumi,
Kobayashi, Kei,
Oyabu, Noriaki |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2015
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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