On radiation damage in FIB-prepared softwood samples measured by scanning X-ray diffraction
The high flux density encountered in scanning X-ray nanodiffraction experiments can lead to severe radiation damage to biological samples. However, this technique is a suitable tool for investigating samples to high spatial resolution. The layered cell wall structure of softwood tracheids is an inte...
Description complète
Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 22(2015), 2 vom: 07. März, Seite 267-72
|
|---|
| Auteur principal: |
Storm, Selina
(Auteur) |
|---|
| Autres auteurs: |
Ogurreck, Malte,
Laipple, Daniel,
Krywka, Christina,
Burghammer, Manfred,
Di Cola, Emanuela,
Müller, Martin |
|---|
| Format: | Article en ligne
|
|---|
| Langue: | English |
|---|
| Publié: |
2015
|
|---|
| Accès à la collection: | Journal of synchrotron radiation
|
|---|
| Sujets: | Journal Article
Research Support, Non-U.S. Gov't
FIB
nanodiffraction
radiation damage
scanning X-ray diffraction |
|---|