Simultaneous X-ray diffraction and phase-contrast imaging for investigating material deformation mechanisms during high-rate loading
Using a high-speed camera and an intensified charge-coupled device (ICCD), a simultaneous X-ray imaging and diffraction technique has been developed for studying dynamic material behaviors during high-rate tensile loading. A Kolsky tension bar has been used to pull samples at 1000 s(-1) and 5000 s(-...
Ausführliche Beschreibung
Bibliographische Detailangaben
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 22(2015), 1 vom: 21. Jan., Seite 49-58
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1. Verfasser: |
Hudspeth, M
(VerfasserIn) |
Weitere Verfasser: |
Sun, T,
Parab, N,
Guo, Z,
Fezzaa, K,
Luo, S,
Chen, W |
Format: | Online-Aufsatz
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Sprache: | English |
Veröffentlicht: |
2015
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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Schlagworte: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
Kolsky bar
dynamic diffraction |